IP Library Assignment 017407/0521
Patent Assignment
Reel/Frame 017407/0521

Assignment of Assignor's Interest

Recorded: 2005-12-27 Pages: 3
Assignors
NAKAGAWA, HARUNOBU
Executed: 2005-12-08
AOKI, MINORU
Executed: 2005-11-19
YAMADA, SHIGEKAZU
Executed: 2005-12-06
Assignee
SPANSION LLC
ONE AMD PLACE, SUNNYVALE, CALIFORNIA, 94088
Covered Property (1)
Semiconductor Device, Semiconductor Device Testing Method, and Programming Method
Patent: 7,184,338 →
Application: 11/215,253 →
Publication: US 2006/0077736
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement Jun 4, 2010
From: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY INC.; SPANSION TECHNOLOGY LLC
To: BARCLAYS BANK PLC
Reel/Frame 024522/0338 →
Release of Lien on Patent Aug 5, 2013
From: BARCLAYS BANK PLC
To: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY INC.; SPANSION TECHNOLOGY LLC
Reel/Frame 030945/0505 →
Assignment of Assignor's Interest Jun 23, 2015
From: SPANSION LLC
To: VALLEY DEVICE MANAGEMENT
Reel/Frame 036011/0839 →