Patent Assignment
Reel/Frame 017419/0015
Assignment of Assignor's Interest
Recorded: 2006-03-31
Pages: 3
Assignors
NAKATSU, SHINICHI
Executed: 2006-02-10
ISOGAI, HIDEO
Executed: 2006-02-10
MASUMOTO, TAKEHIRO
Executed: 2006-02-10
NISHIZAWA, KAZUYUKI
Executed: 2006-02-10
TSUBOI, TOSHIHIDE
Executed: 2006-02-10
ETOU, KIMIHARU
Executed: 2006-02-10
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit for Reducing Number of Contact Pads to Be Probed in Probe Test
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.