IP Library › Assignment 017495/0534
Patent Assignment
Reel/Frame 017495/0534

Assignment of Assignor's Interest

Recorded: 2006-04-19 Pages: 3
Assignors
SIPILA, HEIKKI JOHANNES
Executed: 2004-11-05
KAIJANSAARI, RIITTA
Executed: 2004-11-05
Assignee
OXFORD INSTRUMENTS ANALYTICAL OY
NIHTISILLANKUJA 5, ESPOO, 02630, FINLAND
Covered Property (1)
Measurement Arrangement for X-Ray Fluoresence Analysis
Patent: 7,065,174 →
Application: 10/987,145 →
Publication: US 2005/0129174
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 12, 2004
From: SIPILA, HEIKKI JOHANNES; KAIJANSAARI, RITTA
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 015993/0715 →
Assignment of Assignor's Interest May 17, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
Reel/Frame 042414/0385 →
Corrective Assignment to Correct the Assignee's Country Name Previously Recorded at Reel: 042414 Frame: 0385. Assignor(S) Hereby Confirms the Assignment. Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL
Reel/Frame 042931/0287 →
Corrective Assignment to Correct the Assignee's Name Previously Recorded at Reel: 042414 Frame: 0385. Assignor(S) Hereby Confirms the Assignment. Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
Reel/Frame 042932/0159 →