IP Library Assignment 042414/0385
Patent Assignment
Reel/Frame 042414/0385

Assignment of Assignor's Interest

Recorded: 2017-05-17 Pages: 7
Assignor
OXFORD INSTRUMENTS ANALYTICAL OY
Executed: 2017-03-29
Assignee
OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
C/O DERBY BUSINESS PARK TARVONSALMENKATU 17, PL 85 02631, ESPOO, 02600, UNITED KINGDOM
Covered Properties (12)
X-Ray Fluorescence Measuring System Making Use of Polarized Excitation Radiation, and X-Ray Tube
Patent: 6,049,589 →
Application: 09/103,389 →
Method and Arrangement for Applying Optical Emission Spectroscopy to the Detection of the 193 Nm Spectral Line of Carbon
Patent: 6,934,021 →
Application: 10/650,014 →
Publication: US 2004/0160602
Measurement Arrangement for X-Ray Fluoresence Analysis
Patent: 7,065,174 →
Application: 10/987,145 →
Publication: US 2005/0129174
Adapter and Analyser Device for Performing X-Ray Fluorescence Analysis on Hot Surfaces
Patent: 7,020,238 →
Application: 11/047,247 →
Measurement Apparatus and Method for Determining the Material Composition of a Sample by Combined X-Ray Fluorescence Analysis and Laser-Induced Breakdown Spectroscopy
Patent: 7,233,643 →
Application: 11/134,740 →
Publication: US 2006/0262900
X-Ray Tube of the End Window Type, and an X-Ray Fluorescence Analyzer
Patent: 7,203,283 →
Application: 11/358,835 →
Method and Arrangement for Non-Destructive Composition Analysis of Delicate Samples
Patent: 7,426,019 →
Application: 11/417,689 →
Publication: US 2006/0262302
X-Ray Fluorescence Analyzer Having Means for Producing Lowered Pressure, and an X-Ray Fluorescence Measurement Method Using Lowered Pressure
Patent: 7,409,037 →
Application: 11/429,172 →
Publication: US 2007/0269003
Selective Irradiation of Small Target Area in X-Ray Fluorescent Spectroscopy
Patent: 7,443,959 →
Application: 11/545,300 →
Publication: US 2008/0095318
Compensation for Fluctuations Over Time in the Radiation Characteristics of the X-Ray Source in an Xrf Analyser
Patent: 7,474,730 →
Application: 11/581,929 →
Publication: US 2008/0095309
Practical Laser Induced Breakdown Spectroscopy Unit
Patent: 7,394,537 →
Application: 11/644,187 →
Publication: US 2008/0151241
Filter for X-Ray Radiation, and an Arrangement for Using Filtered X-Ray Radiation for Excitation
Patent: 7,508,906 →
Application: 11/789,854 →
Publication: US 2008/0267348
Related Assignments (17)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 31, 1998
From: SIPILA, HEIKKI
To: METOREX INTERNATIONAL OY
Reel/Frame 009424/0321 →
Assignment of Assignor's Interest Apr 29, 2004
From: EKLIN, TERO; KRAPU, MIKKO
To: METOREX INTERNATIONAL OY
Reel/Frame 015274/0861 →
Assignment of Assignor's Interest Nov 12, 2004
From: SIPILA, HEIKKI JOHANNES; KAIJANSAARI, RITTA
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 015993/0715 →
Change of Name Apr 6, 2005
From: METOREX INTERNATIONAL OY
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 016438/0817 →
Assignment of Assignor's Interest Apr 25, 2005
From: KANTONEN, ESKO JUHANI; KESALA, JANNE ADOLF PETTERI; PUUSAARI, ERKKI TAPANI; SIPILA, HEIKKI JOHANNES
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 016497/0469 →
Assignment of Assignor's Interest Sep 17, 2005
From: SIPILA, KEIKKI JOHANNES; ELKIN, TERO; KUPARINEN, KAI
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 016549/0487 →
Assignment of Assignor's Interest Feb 21, 2006
From: PUUSAARI, ERKKI TAPANI
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 017581/0739 →
Assignment of Assignor's Interest Apr 19, 2006
From: SIPILA, HEIKKI JOHANNES; KAIJANSAARI, RIITTA
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 017495/0534 →
Assignment of Assignor's Interest May 5, 2006
From: PUUSAARI, ERKKI TAPANI; RINTAMAKI, HANNU
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 017878/0346 →
Assignment of Assignor's Interest Jul 27, 2006
From: EKLIN, TERO
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 018139/0010 →
Assignment of Assignor's Interest Dec 29, 2006
From: KANTONEN, ESKO JUHANI; SIPILA, HEIKKI JOHANNES
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 018742/0322 →
Assignment of Assignor's Interest Feb 12, 2007
From: PUUSAARI, ERKKI TAPANI; SHIROKOBROD, OLEG
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 018901/0020 →
Assignment of Assignor's Interest Apr 2, 2007
From: LINDFORS, PAMELA; KRAPU, MIKKO
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 019124/0449 →
Assignment of Assignor's Interest Jun 28, 2007
From: PUUSAARI, ERKKI; ELLIS, ANDY
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 019515/0894 →
Corrective Assignment to Correct the Assignee's Name Previously Recorded at Reel: 042414 Frame: 0385. Assignor(S) Hereby Confirms the Assignment. Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
Reel/Frame 042932/0159 →
Corrective Assignment to Correct the Assignee's Country Name Previously Recorded at Reel: 042414 Frame: 0385. Assignor(S) Hereby Confirms the Assignment. Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL
Reel/Frame 042931/0287 →
Change of Name Jan 25, 2018
From: OXFORD INSTRUMENTS INDUSTRIAL ANALYTICAL OY
To: HITACHI HIGH-TECH ANALYTICAL SCIENCE FINLAND OY
Reel/Frame 045146/0897 →