Patent Assignment
Reel/Frame 045146/0897
Change of Name
Recorded: 2018-01-25
Pages: 4
Assignor
OXFORD INSTRUMENTS INDUSTRIAL ANALYTICAL OY
Executed: 2017-10-24
Assignee
HITACHI HIGH-TECH ANALYTICAL SCIENCE FINLAND OY
C/O DERBY BUSINESS PARK TARVONSALMENKATU 17, PL 85 02631, ESPOO, 02600, FINLAND
Covered Properties
(10)
Method and Arrangement for Applying Optical Emission Spectroscopy to the Detection of the 193 Nm Spectral Line of Carbon
Adapter and Analyser Device for Performing X-Ray Fluorescence Analysis on Hot Surfaces
Patent:
7,020,238 →
Application:
11/047,247 →
Measurement Apparatus and Method for Determining the Material Composition of a Sample by Combined X-Ray Fluorescence Analysis and Laser-Induced Breakdown Spectroscopy
X-Ray Tube of the End Window Type, and an X-Ray Fluorescence Analyzer
Patent:
7,203,283 →
Application:
11/358,835 →
Method and Arrangement for Non-Destructive Composition Analysis of Delicate Samples
X-Ray Fluorescence Analyzer Having Means for Producing Lowered Pressure, and an X-Ray Fluorescence Measurement Method Using Lowered Pressure
Selective Irradiation of Small Target Area in X-Ray Fluorescent Spectroscopy
Compensation for Fluctuations Over Time in the Radiation Characteristics of the X-Ray Source in an Xrf Analyser
Practical Laser Induced Breakdown Spectroscopy Unit
Filter for X-Ray Radiation, and an Arrangement for Using Filtered X-Ray Radiation for Excitation
Related Assignments
(14)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 29, 2004
From: EKLIN, TERO; KRAPU, MIKKO
To: METOREX INTERNATIONAL OY
Reel/Frame 015274/0861 →
Change of Name
Apr 6, 2005
From: METOREX INTERNATIONAL OY
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 016438/0817 →
Assignment of Assignor's Interest
Apr 25, 2005
From: KANTONEN, ESKO JUHANI; KESALA, JANNE ADOLF PETTERI; PUUSAARI, ERKKI TAPANI; SIPILA, HEIKKI JOHANNES
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 016497/0469 →
Assignment of Assignor's Interest
Sep 17, 2005
From: SIPILA, KEIKKI JOHANNES; ELKIN, TERO; KUPARINEN, KAI
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 016549/0487 →
Assignment of Assignor's Interest
Feb 21, 2006
From: PUUSAARI, ERKKI TAPANI
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 017581/0739 →
Assignment of Assignor's Interest
May 5, 2006
From: PUUSAARI, ERKKI TAPANI; RINTAMAKI, HANNU
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 017878/0346 →
Assignment of Assignor's Interest
Jul 27, 2006
From: EKLIN, TERO
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 018139/0010 →
Assignment of Assignor's Interest
Dec 29, 2006
From: KANTONEN, ESKO JUHANI; SIPILA, HEIKKI JOHANNES
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 018742/0322 →
Assignment of Assignor's Interest
Feb 12, 2007
From: PUUSAARI, ERKKI TAPANI; SHIROKOBROD, OLEG
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 018901/0020 →
Assignment of Assignor's Interest
Apr 2, 2007
From: LINDFORS, PAMELA; KRAPU, MIKKO
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 019124/0449 →
Assignment of Assignor's Interest
Jun 28, 2007
From: PUUSAARI, ERKKI; ELLIS, ANDY
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 019515/0894 →
Assignment of Assignor's Interest
May 17, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
Reel/Frame 042414/0385 →
Corrective Assignment to Correct the Assignee's Name Previously Recorded at Reel: 042414 Frame: 0385. Assignor(S) Hereby Confirms the Assignment.
Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
Reel/Frame 042932/0159 →
Corrective Assignment to Correct the Assignee's Country Name Previously Recorded at Reel: 042414 Frame: 0385. Assignor(S) Hereby Confirms the Assignment.
Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL
Reel/Frame 042931/0287 →