Patent Assignment
Reel/Frame 016438/0817
Change of Name
Recorded: 2005-04-06
Pages: 7
Assignor
METOREX INTERNATIONAL OY
Executed: 2004-10-28
Assignee
OXFORD INSTRUMENTS ANALYTICAL OY
NIHTISILLANKUJA 5, ESPOO, 02630, FINLAND
Covered Properties
(9)
X-Ray Fluorescence Measuring System Making Use of Polarized Excitation Radiation, and X-Ray Tube
Patent:
6,049,589 →
Application:
09/103,389 →
Imaging System Functioning on Submillimeter Waves
Patent:
6,242,740 →
Application:
09/151,325 →
Radiation Detector, Arrangement and Method for Measuring Radioactive Radiation, Where Continuous Low-Energy Background Noise Is Reduced
Superconducting Antenna-Coupled Hot-Spot Microbolometer, Methods for Its Manufacture and Use, and a Bolometric Imaging Arrangement
Imaging X-Ray Detector Based on Direct Conversion
Method and Arrangement for Applying Optical Emission Spectroscopy to the Detection of the 193 Nm Spectral Line of Carbon
Application:
10/609,817 →
Publication:
US 2004/0051866
Method and Arrangement for Applying Optical Emission Spectroscopy to the Detection of the 193 Nm Spectral Line of Carbon
Drift-Type Detector with Limited Noise Level
Method and Circuit Arrangement for Compensating for Rate Dependent Change of Conversion Factor in a Drift-Type Radiation Detector and a Detector Appliance
Related Assignments
(15)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 31, 1998
From: SIPILA, HEIKKI
To: METOREX INTERNATIONAL OY
Reel/Frame 009424/0321 →
Assignment of Assignor's Interest
Oct 15, 1998
From: LUUKANEN, ARTTU; SIPILA, HEIKKI; VIITANEN, VELI-PEKKA
To: METOREX INTERNATIONAL OY
Reel/Frame 009535/0087 →
Assignment of Assignor's Interest
Dec 3, 2002
From: SIPILA, HEIKKI JOHANNES; KIURU, ERKKI SAKARI
To: METOREX INTERNATIONAL OY
Reel/Frame 013547/0081 →
Assignment of Assignor's Interest
May 23, 2003
From: LUUKANEN, ARTTU
To: METOREX INTERNATIONAL OY
Reel/Frame 014114/0616 →
Assignment of Assignor's Interest
Jun 30, 2003
From: EKLIN, TERO; KRAPU, MIKKO
To: METOREX INTERNATIONAL OY
Reel/Frame 014258/0757 →
Assignment of Assignor's Interest
Sep 11, 2003
From: SIPILA, HEIKKI; BOURGOIN, JACQUES
To: METOREX INTERNATIONAL OY; BOURGOIN, JACQUES
Reel/Frame 014487/0274 →
Assignment of Assignor's Interest
Apr 29, 2004
From: EKLIN, TERO; KRAPU, MIKKO
To: METOREX INTERNATIONAL OY
Reel/Frame 015274/0861 →
Assignment of Assignor's Interest
Sep 9, 2004
From: KIURU, ERKKI SAKARI; SIPILA, HEIKKI JOHANNES
To: METOREX INTERNATIONAL OY
Reel/Frame 015769/0214 →
Assignment of Assignor's Interest
Feb 15, 2005
From: KIURU, ERKKI SAKARI
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 016262/0492 →
Assignment of Assignor's Interest
May 17, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
Reel/Frame 042414/0385 →
Assignment of Assignor's Interest
May 17, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENT TECHNOLOGIES OY
Reel/Frame 042414/0954 →
Corrective Assignment to Correct the Assignee's Name Previously Recorded at Reel: 042414 Frame: 0385. Assignor(S) Hereby Confirms the Assignment.
Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
Reel/Frame 042932/0159 →
Corrective Assignment to Correct the Assignee's Country Name Previously Recorded at Reel: 042414 Frame: 0385. Assignor(S) Hereby Confirms the Assignment.
Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL
Reel/Frame 042931/0287 →
Corrective Assignment to Correct the Assignee Name and Country Previously Recorded at Reel: 042414 Frame: 0954. Assignor(S) Hereby Confirms the Assignment .
Jul 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS TECHNOLOGIES OY
Reel/Frame 043289/0703 →
Change of Name
Jan 25, 2018
From: OXFORD INSTRUMENTS INDUSTRIAL ANALYTICAL OY
To: HITACHI HIGH-TECH ANALYTICAL SCIENCE FINLAND OY
Reel/Frame 045146/0897 →