IP Library Granted Patent US 7,409,037
Granted Patent B2
US 7,409,037 · App. 11/429,172 · Granted Aug 5, 2008

X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure

Assignee: Oxford Instruments Analytical Oy
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Quick Facts
Patent No.
US 7,409,037
App. No.
11/429,172
Granted
Aug 5, 2008
Kind
B2
Abstract

An X-ray fluorescence analyzer has a structure that defines a chamber ( 102 ). There is a window ( 103 ) to the chamber in a surface that is to come next to a sample ( 101 ) outside the chamber. The window ( 103 ) comprises a foil that is permeable to X-rays. A detector ( 104 ) receives fluorescent X-rays through said window ( 103 ). A low pressure source ( 508 ) is coupled to the chamber ( 102 ) and configured to controllably lower the pressure of a gaseous medium in the chamber ( 102 ) to a pressure value between 760 torr and 10 torr. The X-ray fluorescence analyzer maintains a lowered pressure of a value between 760 torr and 10 torr in the chamber ( 102 ) for the duration of an X-ray fluorescence measurement.

Claims (29)

1. An X-ray fluorescence analyzer, comprising:

a structure that defines a chamber;

a window to the chamber in a surface configured to come next to a sample that is on the outside of the chamber, said window comprising a foil that is permeable to X-rays;

a detector configured to receive fluorescent X-rays through said window;

a low pressure source coupled to the chamber and configured to controllably lower the pressure of a gaseous medium in the chamber to a pressure value between 760 torr and 10 torr; and

a density indicator subsystem configured to produce an indication of the density of gaseous medium inside the chamber;

wherein the X-ray fluorescence analyzer is configured to maintain a lowered pressure of a value between 760 torr and 10 torr in the chamber for the duration of an X-ray fluorescence measurement.

2. An X-ray fluorescence analyzer according to claim 1 , wherein the density indicator subsystem comprises a pressure sensor configured to sense the pressure of the gaseous medium inside the chamber.

3. An X-ray fluorescence analyzer according to claim 1 , wherein the density indicator subsystem comprises a temperature sensor configured to sense the temperature of the gaseous medium inside the chamber.

4. An X-ray fluorescence analyzer according to claim 3 , wherein the temperature sensor is outside the chamber, so that it is configured to only indirectly sense the temperature of the gaseous medium inside the chamber by sensing the temperature of the structure that defines the chamber.

5. An X-ray fluorescence analyzer according to claim 1 , wherein the low pressure source is a pump integrated to the X-ray fluorescence analyzer.

6. An X-ray fluorescence analyzer according to claim 5 , comprising:

a conduit configured to lead gaseous medium from the chamber to said pump; and

an electrically controllable valve along said conduit.

7. A method for making an X-ray fluorescence measurement of a sample, comprising:

drawing gaseous medium from a chamber, a part of which is located between the sample and a detector, until the pressure of gaseous medium inside said chamber is at a predefined value between 760 torr and 10 torr;

maintaining the pressure of said gaseous medium at said predefined value;

receiving fluorescent X-rays from said sample to said detector through a window that constitutes a part of a structure defining said chamber while maintaining the pressure of said gaseous medium at said predefined value;

detecting and storing the intensity at certain energies of the received fluorescent X-rays; and

obtaining an indication of the density of gaseous medium inside said chamber during the reception of fluorescent X-rays.

8. A method according to claim 7 , wherein obtaining an indication of the density of gaseous medium inside said chamber comprises obtaining an indication of at least one of pressure and temperature inside said chamber.

9. A method according to claim 8 , comprising deriving the density of gaseous medium inside said chamber through applying the state equation of gases.

10. A method according to claim 7 , comprising signal processing in which an effect of attenuation in gaseous medium is compensated for in the stored fluorescent X-ray intensities through using knowledge about the density of gaseous medium in the chamber during the reception of fluorescent X-rays.

11. A computer-readable medium encoded with a data structure, comprising machine-readable instructions that when executed on a computer cause the execution of the steps of:

allowing a low pressure source to draw gaseous medium from a chamber, a part of which is located between a sample and a detector, until the pressure of gaseous medium inside said chamber is at a predefined value between 760 torr and 10 torr;

maintaining the pressure of said gaseous medium at said predefined value;

receiving fluorescent X-rays from said sample to said detector through a window that constitutes a part of a structure defining said chamber while maintaining the pressure of said gaseous medium at said predefined value;

detecting and storing the intensity at certain energies of the received fluorescent X-rays; and

compensating for an effect of attenuation in gaseous medium in the stored fluorescent X-ray intensities through using knowledge about the density of gaseous medium in the chamber during the reception of fluorescent X-rays.

Assignments (5)
CHANGE OF NAME Recorded Jan 25, 2018
From: OXFORD INSTRUMENTS INDUSTRIAL ANALYTICAL OY
To: HITACHI HIGH-TECH ANALYTICAL SCIENCE FINLAND OY
Reel/Frame 045146/0897 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S COUNTRY NAME PREVIOUSLY RECORDED AT REEL: 042414 FRAME: 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL
Reel/Frame 042931/0287 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S NAME PREVIOUSLY RECORDED AT REEL: 042414 FRAME: 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
Reel/Frame 042932/0159 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
Reel/Frame 042414/0385 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 5, 2006
From: PUUSAARI, ERKKI TAPANI; RINTAMAKI, HANNU
To: OXFORD INSTRUMENTS ANALYTICAL OY
Reel/Frame 017878/0346 →
Continuity (1)
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