Selective irradiation of small target area in X-ray fluorescent spectroscopy
An X-ray fluorescence analyzer device comprises an X-ray source and a sample window. Between the X-ray source and the sample window there are a collimator plate with a plurality of microscopic pores and an annular plate comprising material essentially opaque to X-rays. The annular plate defines an area transparent to X-rays. The pores in said collimator plate let through collimated X-rays radiated by said X-ray source towards said sample window. The area transparent to X-rays in said annular plate spatially limits in a transverse direction a beam of X-rays radiated by said X-ray source towards said sample window.
1. An arrangement for collimating a beam of incident X-rays in an X-ray fluorescence analyzer device, comprising:
a collimator plate with a plurality of pores that penetrate through at least an essential part of the thickness of the collimator plate and that have a diameter smaller than 100 micrometers, and
an annular plate comprising material essentially opaque to X-rays, said annular plate defining an area transparent to X-rays;
wherein said collimator plate and said annular plate are adapted to be placed in said X-ray fluorescence analyzer device between an X-ray source and a sample, and wherein said plurality of pores in said collimator plate are adapted to let through at least a part of X-rays radiated by said X-ray source, and wherein edges of said area transparent to X-rays in said annular plate are adapted to spatially limit in a transverse direction a beam of X-rays radiated by said X-ray source, and wherein walls of at least some of said pores comprise a coating, the material of the coating being one of: iridium, ruthenium, osmium, platinum, gold.
2. An arrangement according to claim 1 , wherein said collimator plate is a glass capillary plate, a body of which is made of lead oxide glass.
3. An arrangement according to claim 1 , wherein said collimator plate is a semiconductor wafer with a plurality of anisotropically etched pores therethrough.
4. An arrangement according to claim 3 , wherein the semiconductor material of said wafer is germanium.
5. An arrangement according to claim 1 , wherein said annular plate is an edge section of the collimator plate, so that said area transparent to X-rays is a section of said collimator plate where said pores are located.
6. An arrangement according to claim 1 , wherein said annular plate is an annular layer of a material opaque to X-rays, attached to one surface of said collimator plate.
7. An arrangement according to claim 1 , wherein said collimator plate and said annular plate are separate mechanical entities.
8. An arrangement according to claim 7 , wherein said annular plate defines a plurality of openings with different dimensions, and said annular plate is adapted to be moved in relation to said collimator plate in order to selectively make a desired one of said plurality of openings coincide with at least a part of said collimator plate.
9. An arrangement according to claim 1 , comprising two collimator plates in sequence, each of them having a certain direction of pores that pass through at least an essential part of the thickness of the respective collimator plate, wherein at least one of said two collimator plates is movable between a first position, in which the direction of pores in said one of said two collimator plates is different from the direction of pores in the other collimator plate, and a second position, in which the direction of pores in said one of said two collimator plates is the same as the direction of pores in the other collimator plate.
10. An X-ray fluorescence analyzer device, comprising:
an X-ray source,
a sample window to be placed adjacent to a sample, and
between the X-ray source and the sample window a collimator plate with a plurality of pores that penetrate through at least an essential part of the thickness of the collimator plate and that have a diameter smaller than 100 micrometers, and an annular plate comprising material essentially opaque to X-rays, said annular plate defining an area transparent to X-rays;
wherein said plurality of pores in said collimator plate are adapted to let through at least a part of X-rays radiated by said X-ray source towards said sample window, and wherein edges of said area transparent to X-rays in said annular plate are adapted to spatially limit in a transverse direction a beam of X-rays radiated by said X-ray source towards said sample window, and wherein walls of at least some of said pores comprise a coating, the material of the coating being one of: iridium, ruthenium, osmium, platinum, gold.
11. An X-ray fluorescence analyzer device according to claim 10 , wherein said collimator plate is a glass capillary plate, a body of which is made of lead oxide glass.
12. An X-ray fluorescence analyzer device according to claim 10 , wherein said collimator plate is a semiconductor wafer with a plurality of anisotropically etched pores therethrough.
13. An X-ray fluorescence analyzer device according to claim 12 , wherein the semiconductor material of said wafer is germarnum.
14. An X-ray fluorescence analyzer device according to claim 10 , comprising a movable holder mechanism that is movable between a first position, in which at least one of said collimator plate and said annular plate is between the X-ray source and the sample window, and a second position, in which said at least one of said collimator plate and said annular plate is not between the X-ray source and the sample window.
15. An X-ray fluorescence analyzer device according to claim 14 , wherein in said second position said movable holder mechanism is configured to hold a filter between the X-ray source and the sample window.
16. An X-ray fluorescence analyzer device according to claim 10 , comprising an optical aiming aid configured to convey to a display means an optical image of a target area of a sample brought adjacent to the sample window.
17. An X-ray fluorescence analyzer device according to claim 16 , comprising an illumination means configured to illuminate said target area in said sample with visible light.
18. An arrangement for collimating a beam of incident X-rays in an X-ray fluorescence analyzer device, comprising:
a collimator plate with a plurality of pores that penetrate through at least an essential part of the thickness of the collimator plate and that have a diameter smaller than 100 micrometers, and
an annular plate comprising material essentially opaque to X-rays, said annular plate defining an area transparent to X-rays;
wherein said collimator plate and said annular plate are adapted to be placed in said X-ray fluorescence analyzer device between an X-ray source and a sample, and wherein said plurality of pores in said collimator plate are adapted to let through at least a part of X-rays radiated by said X-ray source, and wherein edges of said area transparent to X-rays in said annular plate are adapted to spatially limit in a transverse direction a beam of X-rays radiated by said X-ray source, and wherein said collimator plate is a germanium wafer with a plurality of anisotropically etched pores therethrough.