Patent Assignment
Reel/Frame 018901/0020
Assignment of Assignor's Interest
Recorded: 2007-02-12
Pages: 3
Assignee
OXFORD INSTRUMENTS ANALYTICAL OY
NIHTISILLANKUJA 5, ESPOO, FI-02630, FINLAND
Covered Property
(1)
Compensation for Fluctuations Over Time in the Radiation Characteristics of the X-Ray Source in an Xrf Analyser
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
May 17, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
Reel/Frame 042414/0385 →
Corrective Assignment to Correct the Assignee's Country Name Previously Recorded at Reel: 042414 Frame: 0385. Assignor(S) Hereby Confirms the Assignment.
Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL
Reel/Frame 042931/0287 →
Corrective Assignment to Correct the Assignee's Name Previously Recorded at Reel: 042414 Frame: 0385. Assignor(S) Hereby Confirms the Assignment.
Jun 21, 2017
From: OXFORD INSTRUMENTS ANALYTICAL OY
To: OXFORD INSTRUMENTS INDUSTRIAL ANALYSIS OY
Reel/Frame 042932/0159 →
Change of Name
Jan 25, 2018
From: OXFORD INSTRUMENTS INDUSTRIAL ANALYTICAL OY
To: HITACHI HIGH-TECH ANALYTICAL SCIENCE FINLAND OY
Reel/Frame 045146/0897 →