Patent Assignment
Reel/Frame 017587/0183
Assignment of Assignor's Interest
Recorded: 2006-02-13
Pages: 3
Assignor
BYRKETT, BRUCE E.
Executed: 2006-01-31
Assignee
CYPRESS SEMICONDUCTOR CORPORATION
198 CHAMPION COURT, SAN JOSE, CALIFORNIA, 95134
Covered Property
(1)
Method of voltage stress testing of core blocks and regulator fets
Application:
60/773,001 →
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.