IP Library › Assignment 017631/0127
Patent Assignment
Reel/Frame 017631/0127

Assignment of Assignor's Interest

Recorded: 2006-03-07 Pages: 4
Assignors
AMEMIYA, TAKASHI
Executed: 2006-01-31
TSUKADA, SHUICHI
Executed: 2006-01-31
Assignee
TOKYO ELECTRON LIMITED
3-6, AKASAKA 5-CHOME, MINATO-KU, TOKYO 107-8481, JAPAN
Covered Property (1)
Inspection Contact Structure and Probe Card
Patent: 7,267,551 →
Application: 11/270,444 →
Publication: US 2006/0154497
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 6, 2008
From: TOKYO ELECTRON LIMITED (50%)
To: JSR CORPORATION (50%)
Reel/Frame 021651/0919 →
Assignment of Assignor's Interest May 20, 2014
From: TOKYO ELECTRON LIMITED
To: JSR CORPORATION
Reel/Frame 032928/0745 →
Assignment of Assignor's Interest Jul 11, 2014
From: JSR CORPORATION
To: ISC CO., LTD.
Reel/Frame 033301/0837 →