IP Library › Assignment 032928/0745
Patent Assignment
Reel/Frame 032928/0745

Assignment of Assignor's Interest

Recorded: 2014-05-20 Pages: 2
Assignor
TOKYO ELECTRON LIMITED
Executed: 2014-04-24
Assignee
JSR CORPORATION
1-9-2, HIGASHI-SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Properties (4)
Inspection Contact Structure and Probe Card
Patent: 7,267,551 →
Application: 11/270,444 →
Publication: US 2006/0154497
Inspection Contact Structure and Probe Card
Patent: 7,719,296 →
Application: 11/819,273 →
Publication: US 2008/0211528
Inspection Contact Structure and Probe Card
Patent: 7,701,234 →
Application: 11/819,274 →
Publication: US 2008/0211523
Probe Card for Inspecting Electric Properties of an Object
Patent: 7,679,385 →
Application: 11/822,577 →
Publication: US 2008/0007280
Related Assignments (7)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 7, 2006
From: AMEMIYA, TAKASHI; TSUKADA, SHUICHI
To: TOKYO ELECTRON LIMITED
Reel/Frame 017631/0127 →
Assignment of Assignor's Interest Sep 21, 2007
From: AMEMIYA, TAKASHI; TSUKADA, SYUICHI
To: TOKYO ELECTRON LIMITED
Reel/Frame 019884/0611 →
Assignment of Assignor's Interest Oct 6, 2008
From: TOKYO ELECTRON LIMITED (50%)
To: JSR CORPORATION (50%)
Reel/Frame 021656/0991 →
Assignment of Assignor's Interest Oct 6, 2008
From: TOKYO ELECTRON LIMITED (50%)
To: JSR CORPORATION (50%)
Reel/Frame 021656/0998 →
Assignment of Assignor's Interest Oct 6, 2008
From: TOKYO ELECTRON LIMITED (50%)
To: JSR CORPORATION (50%)
Reel/Frame 021656/0996 →
Assignment of Assignor's Interest Oct 6, 2008
From: TOKYO ELECTRON LIMITED (50%)
To: JSR CORPORATION (50%)
Reel/Frame 021651/0919 →
Assignment of Assignor's Interest Jul 11, 2014
From: JSR CORPORATION
To: ISC CO., LTD.
Reel/Frame 033301/0837 →