IP Library › Assignment 017655/0324
Patent Assignment
Reel/Frame 017655/0324

Assignment of Assignor's Interest

Recorded: 2006-05-22 Pages: 3
Assignors
KU, YI-SHA
Executed: 2006-05-05
PANG, HSIU-LAN
Executed: 2006-05-05
Assignee
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
195, SECTION 4 CHUNG HSING ROAD, TAIPEI, TAIWAN
Covered Property (1)
Methods and Systems for Determining Overlay Error Based on Target Image Symmetry
Patent: 7,477,396 →
Application: 11/360,031 →
Publication: US 2006/0197950
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest May 22, 2006
From: SMITH, NIGEL PETER
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 017655/0327 →
Merger Jun 22, 2007
From: ALLOY MERGER CORPORATION; ACCENT OPTICAL TECHNOLOGIES, INC.
To: ACCENT OPTICAL TECHNOLOGIES NANOMETRICS, INC.
Reel/Frame 019469/0299 →
Assignment of Assignor's Interest Jul 11, 2007
From: ACCENT OPTICAL TECHNOLOGIES NANOMETRICS, INC.
To: NANOMETRICS INCORPORATED
Reel/Frame 019543/0863 →
Change of Name Apr 30, 2020
From: NANOMETRICS INCORPORATED
To: ONTO INNOVATION INC.
Reel/Frame 052544/0224 →