IP Library › Assignment 019543/0863
Patent Assignment
Reel/Frame 019543/0863

Assignment of Assignor's Interest

Recorded: 2007-07-11 Pages: 4
Assignor
Assignee
NANOMETRICS INCORPORATED
1550 BUCKEYE DRIVE, MILPITAS, CALIFORNIA, 95035-7418
Covered Properties (15)
Overlay Measurement Target
Patent: 7,379,184 →
Application: 11/035,652 →
Publication: US 2006/0151890
Apparatus and method for non-contact assessment of a constituent in semiconductor workpieces
Application: 11/177,735 →
Publication: US 2007/0008526
Apparatus and Method for Non-Contact Assessment of a Constituent in Semiconductor Substrates
Patent: 7,410,815 →
Application: 11/212,971 →
Publication: US 2007/0048948
Method for designing an overlay mark
Application: 11/288,834 →
Publication: US 2006/0117293
Scatterometry Method with Characteristic Signatures Matching
Patent: 7,532,317 →
Application: 11/319,677 →
Publication: US 2006/0146347
Apparatuses and methods for analyzing semiconductor workpieces
Application: 11/343,500 →
Publication: US 2007/0176119
Methods and Systems for Determining Overlay Error Based on Target Image Symmetry
Patent: 7,477,396 →
Application: 11/360,031 →
Publication: US 2006/0197950
Apparatus and method for enhanced critical dimension scatterometry
Application: 11/361,308 →
Publication: US 2006/0273263
Scatterometer Having a Computer System That Reads Data from Selected Pixels of the Sensor Array
Patent: 7,511,293 →
Application: 11/361,309 →
Publication: US 2006/0278834
Apparatus and method for enhanced critical dimension scatterometry
Application: 11/361,670 →
Publication: US 2006/0285110
Apparatus and method for enhanced critical dimension scatterometry
Application: 11/361,677 →
Publication: US 2006/0289790
Apparatus and Method for Enhanced Critical Dimension Scatterometry
Patent: 7,615,752 →
Application: 11/361,710 →
Publication: US 2006/0243912
Method for Evaluating Microstructures on a Workpiece Based on the Orientation of a Grating on the Workpiece
Patent: 7,656,542 →
Application: 11/372,757 →
Publication: US 2007/0211261
Apparatuses and methods for enhanced critical dimension scatterometry
Application: 11/453,463 →
Publication: US 2006/0285111
Apparatuses and methods for detecting defects in semiconductor workpieces
Application: 11/475,792 →
Publication: US 2007/0000434
Related Assignments (23)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 13, 2005
From: KU, YI-SHA; PANG, HSIU LAN
To: INDUSTRIAL RESEARCH TECHNOLOGY INSTITUTE
Reel/Frame 016181/0090 →
Assignment of Assignor's Interest Jan 13, 2005
From: SMITH, NIGEL PETER
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 016191/0965 →
Assignment of Assignor's Interest Nov 25, 2005
From: VAGOS, PEDRO
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 017250/0437 →
Assignment of Assignor's Interest Jan 10, 2006
From: KU, YI-SHA; PANG, HSIU LAN
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 017451/0060 →
Assignment of Assignor's Interest Jan 30, 2006
From: HUMMEL, STEVE
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 017560/0776 →
Assignment of Assignor's Interest Feb 9, 2006
From: KO, CHUN-HUNG; KU, YI-SHA; WANG, SHIH CHUN
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 017247/0040 →
Assignment of Assignor's Interest Feb 9, 2006
From: KU, YI-SHA; WANG, SHIH CHUN; KO, CHUN-HUNG
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 017247/0028 →
Assignment of Assignor's Interest Feb 16, 2006
From: SMITH, NIGEL PETER
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 017269/0511 →
Assignment of Assignor's Interest Feb 22, 2006
From: SMITH, NIGEL PETER
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 017279/0237 →
Assignment of Assignor's Interest Mar 9, 2006
From: BUCZKOWSKI, ANDRZEJ
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 017635/0001 →
Assignment of Assignor's Interest May 22, 2006
From: SMITH, NIGEL PETER
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 017655/0327 →
Assignment of Assignor's Interest May 22, 2006
From: KU, YI-SHA; PANG, HSIU-LAN
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 017655/0324 →
Assignment of Assignor's Interest Jun 14, 2006
From: RAYMOND, CHRIS; FORMAN, DARREN
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 017983/0461 →
Assignment of Assignor's Interest Jun 26, 2006
From: BUCZKOWSKI, ANDRZEJ
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 018046/0850 →
Assignment of Assignor's Interest Jun 30, 2006
From: RAYMOND, CHRIS; HUMMEL, STEVE
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 018049/0676 →
Assignment of Assignor's Interest Aug 11, 2006
From: RAYMOND, CHRIS; HUMMEL, STEVE
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 018155/0154 →
Assignment of Assignor's Interest Aug 21, 2006
From: RAYMOND, CHRIS; HUMMEL, STEVE
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 018209/0276 →
Assignment of Assignor's Interest Aug 25, 2006
From: RAYMOND, CHRIS; HUMMEL, STEVE
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 018206/0020 →
Assignment of Assignor's Interest Aug 28, 2006
From: RAYMOND, CHRIS; HUMMEL, STEVE
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 018242/0174 →
Assignment of Assignor's Interest Jan 11, 2007
From: LITTAU, MIKE; FORMAN, DARREN; RAYMOND, CHRIS; HUMMEL, STEVEN
To: ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 018745/0108 →
Merger Jun 22, 2007
From: ALLOY MERGER CORPORATION; ACCENT OPTICAL TECHNOLOGIES, INC.
To: ACCENT OPTICAL TECHNOLOGIES NANOMETRICS, INC.
Reel/Frame 019469/0299 →
Assignment of Assignor's Interest Jul 24, 2008
From: HUMMEL, STEVEN G.
To: NANOMETRICS INCORPORATED
Reel/Frame 021320/0818 →
Change of Name Apr 30, 2020
From: NANOMETRICS INCORPORATED
To: ONTO INNOVATION INC.
Reel/Frame 052544/0224 →