Patent Assignment
Reel/Frame 017767/0648
Assignment of Assignor's Interest
Recorded: 2006-04-05
Pages: 3
Assignors
FUSHIDA, ATSUO
Executed: 2006-02-24
MATSUMIYA, YASUO
Executed: 2006-02-24
SUZUKI, YASUHIRO
Executed: 2006-02-24
SHIMADA, AKIHIRO
Executed: 2006-03-01
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property
(1)
Defect Source Analysis Method, Defect Source Analysis Apparatus, and Method of Manufacturing Semiconductor Device
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 9, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0089 →
Change of Name
Sep 27, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 025046/0478 →
Change of Address
Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →