IP Library Assignment 017810/0764
Patent Assignment
Reel/Frame 017810/0764

Assignment of Assignor's Interest

Recorded: 2006-05-01 Pages: 2
Assignors
YASUTAKE, MASATOSHI
Executed: 2006-04-17
NAKAUE, TAKUYA
Executed: 2006-04-17
WATANABE, KAZUTOSHI
Executed: 2006-04-17
TAKAOKA, OSAMU
Executed: 2006-04-17
UEMOTO, ATSUSHI
Executed: 2006-04-17
WATANABE, NAOYA
Executed: 2006-04-17
SHIKAKURA, YOSHITERU
Executed: 2006-04-17
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOE, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Working Method Using Scanning Probe
Patent: 7,442,925 →
Application: 11/370,006 →
Publication: US 2006/0219901
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →