IP Library Assignment 017958/0783
Patent Assignment
Reel/Frame 017958/0783

Assignment of Assignor's Interest

Recorded: 2006-06-07 Pages: 2
Assignor
NIKAWA, KIYOSHI
Executed: 2006-06-01
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property (1)
Non-Destructive Testing Apparatus and Non-Destructive Testing Method
Patent: 7,484,883 →
Application: 11/447,891 →
Publication: US 2006/0280222
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 4, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025311/0842 →