Non-destructive testing apparatus and non-destructive testing method
View Patent ↗To detect a defect without being limited to the current path of a sample. The presence or absence of a defect in a sample is detected by allowing said sample to stand for a predetermined period of time after heating said sample with a heat source and by observing the temperature distribution formed on said sample by an observation unit.
1. A non-destructive testing method comprising:
allowing a sample to stand for a predetermined period of time after heating said sample with a heat source;
observing the temperature distribution formed on said sample by an observation unit after said predetermined period of time has elapsed; and
detecting the presence or absence of a defect in the sample,
wherein said heat source heats said sample from the reverse side thereof,
wherein said observation unit observes the temperature distribution formed on said sample from the face side thereof, and
wherein said heat source is a substantially ultra-red laser light that is emitted toward said sample.
2. A non-destructive testing method as defined in claim 1 wherein said sample is intercepted from said heat source by a shutter so that heat from said heat source is not transmitted to said observation unit and said sample during observation of the temperature distribution of said sample.
3. A non-destructive testing method as defined in claim 1 wherein, during observation of the temperature distribution on said sample, no laser light is output so that heat from said heat source is not transmitted to said observation unit and said sample.
4. A non-destructive method as defined in claim 1 wherein said sample is isolated from said observation unit by a second shutter so that no heat from said heat source is transmitted to said observation unit during heating of said sample.
5. A non-destructive testing method as defined in claim 1 wherein said observation unit includes mercury cadmium telluride type emission microscope.
6. A non-destructive testing apparatus comprising:
a heat source that heats a sample; and
an observation unit that observes the temperature distribution formed on said sample after allowing said sample to stand for a predetermined period of time after heating said sample,
wherein said heat source heats said sample from the reverse side thereof,
wherein said observation unit observes the temperature distribution formed on said sample from the face side thereof, and
wherein said heat source emits a substantially ultra-red laser light toward said sample.
7. A non-destructive testing apparatus as defined in claim 6 wherein said apparatus includes a first shutter which intercepts said sample from said heat source so that heat from said heat source is not transmitted to said observation unit and said sample during observation of the temperature distribution of said sample.
8. A non-destructive testing apparatus as defined in claim 6 wherein said heat source is capable of stopping of outputting of laser light toward said sample so that heat from said heat source is not transmitted to said observation unit and said sample during observation of the temperature distribution on said sample.
9. A non-destructive apparatus as defined in claim 6 wherein said apparatus includes a second shutter which isolates said sample from said observation unit by a second shutter so that no heat from said heat source is transmitted to said observation unit during heating of said sample.
10. A non-destructive testing apparatus as defined in claim 6 wherein said observation unit includes mercury cadmium telluride type emission microscope.