Patent Assignment
Reel/Frame 018056/0451
Assignment of Assignor's Interest
Recorded: 2006-06-29
Pages: 3
Assignors
YANG, YU-SIN
Executed: 2006-06-13
JUN, CHUNG-SAM
Executed: 2006-06-14
CHUNG, KI-SUK
Executed: 2006-06-23
KIM, TAE-SUNG
Executed: 2006-06-13
LEE, BYUNG-SUG
Executed: 2006-06-13
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416, MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Method of Inspecting for Defects and Apparatus for Performing the Method