IP Library › Assignment 018071/0374
Patent Assignment
Reel/Frame 018071/0374

Assignment of Assignor's Interest

Recorded: 2006-06-23 Pages: 2
Assignor
MITTAL, AVIRAL
Executed: 2006-04-24
Assignee
KONINKLIJKE PHILIPS ELECTRONICS N.V.
GROENEWOUDSEWEG 1, EINDHOVEN, 5621 BA, NETHERLANDS
Covered Property (1)
Delay Fault Test Circuitry and Related Method
Patent: 7,457,992 →
Application: 10/584,705 →
Publication: US 2007/0168158
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 17, 2007
From: KONINKLIJKE PHILIPS ELECTRONICS N.V.
To: NXP B.V.
Reel/Frame 019719/0843 →
Change of Name Aug 31, 2011
From: PHILIPS SEMICONDUCTORS INTERNATIONAL B.V.
To: NXP B.V.
Reel/Frame 026837/0649 →
Assignment of Assignor's Interest Nov 22, 2011
From: NXP B.V.
To: CALLAHAN CELLULAR L.L.C.
Reel/Frame 027265/0798 →