IP Library › Assignment 018071/0935
Patent Assignment
Reel/Frame 018071/0935

Assignment of Assignor's Interest

Recorded: 2006-07-19 Pages: 2
Assignors
HAMAMATSU, AKIRA
Executed: 2006-07-04
MAEDA, SHUNJI
Executed: 2006-07-04
SHIBUYA, HISAE
Executed: 2006-07-04
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Apparatus of Inspecting Defect in Semiconductor and Method of the Same
Patent: 7,474,394 →
Application: 11/488,622 →
Publication: US 2007/0019185
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →