IP Library Assignment 018089/0042
Patent Assignment
Reel/Frame 018089/0042

Assignment of Assignor's Interest

Recorded: 2006-07-07 Pages: 2
Assignors
NAYA, HIDEMITSU
Executed: 2006-06-26
SHIRATO, TAKUYA
Executed: 2006-06-26
KARAKAMA, AKIRA
Executed: 2006-06-26
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHIMBASHI, MINATO-KU, TOKYO 105-8717, JAPAN
Covered Property (1)
Semiconductor Inspection Apparatus
Patent: 7,916,926 →
Application: 11/482,089 →
Publication: US 2007/0024643
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →