IP Library Assignment 018136/0206
Patent Assignment
Reel/Frame 018136/0206

Corrected Assignment-the 2ND Assignee Was Omitted on Both the Previous Cover Sheet and Notice of Recordation

Recorded: 2006-07-27 Pages: 2
Assignors
UTO, SACHIO
Executed: 2005-06-06
NOGUCHI, MINORI
Executed: 2005-06-10
NISHIYAMA, HIDETOSHI
Executed: 2005-06-06
OHSHIMA, YOSHIMASA
Executed: 2005-06-06
HAMAMATSU, AKIRA
Executed: 2005-06-10
JINGU, TAKAHIRO
Executed: 2005-06-06
NAKATA, TOSHIHIKO
Executed: 2005-06-06
WATANABE, MASAHIRO
Executed: 2005-06-06
Assignees
HITACHI, LTD.
6-6, MARUNOUCHI 1-CHOME, CHIYODA-KU, TOKYO, JAPAN
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14 NISHI SHINBASHI MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Detector and Defect Detecting Method
Patent: 7,417,721 →
Application: 10/536,715 →
Publication: US 2006/0124874
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 21, 2005
From: UTO, SACHIO; NOGUCHI, MINORI; NISHIYAMA, HIDETOSHI; OHSHIMA, YOSHIMASA
To: HITACHI, LTD.
Reel/Frame 017720/0385 →
Assignment of Assignor's Interest Dec 4, 2008
From: HITACHI, LTD.; HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 021952/0638 →
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →