IP Library › Assignment 021952/0638
Patent Assignment
Reel/Frame 021952/0638

Assignment of Assignor's Interest

Recorded: 2008-12-04 Pages: 3
Assignors
HITACHI, LTD.
Executed: 2008-11-14
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHIMBASHI, MINATO-KU, TOKYO 105-8717, JAPAN
Covered Properties (2)
Defect Detector and Defect Detecting Method
Patent: 7,417,721 →
Application: 10/536,715 →
Publication: US 2006/0124874
Defects Inspecting Apparatus and Defects Inspecting Method
Patent: 7,768,634 →
Application: 12/192,578 →
Publication: US 2009/0033924
Related Assignments (3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 21, 2005
From: UTO, SACHIO; NOGUCHI, MINORI; NISHIYAMA, HIDETOSHI; OHSHIMA, YOSHIMASA
To: HITACHI, LTD.
Reel/Frame 017720/0385 →
Corrected Assignment-the 2ND Assignee Was Omitted on Both the Previous Cover Sheet and Notice of Recordation Jul 27, 2006
From: UTO, SACHIO; NOGUCHI, MINORI; NISHIYAMA, HIDETOSHI; OHSHIMA, YOSHIMASA
To: HITACHI, LTD.; HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 018136/0206 →
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →