IP Library › Assignment 018137/0292
Patent Assignment
Reel/Frame 018137/0292

Assignment of Assignor's Interest

Recorded: 2006-07-28 Pages: 3
Assignors
IKENAGA, OSAMU
Executed: 2006-06-01
TSUTSUI, TOMOHIRO
Executed: 2006-06-01
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO 105-8001, JAPAN
Covered Property (1)
Semiconductor Mask Inspection Using Die-to-Die and Die-to-Database Comparisons
Patent: 8,036,446 →
Application: 11/439,989 →
Publication: US 2006/0270072
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 4, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 045433/0337 →
Merger Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
Change of Name and Address Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
Change of Name and Address Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →