IP Library › Assignment 018300/0985
Patent Assignment
Reel/Frame 018300/0985

Assignment of Assignor's Interest

Recorded: 2006-09-13 Pages: 2
Assignors
TOYODA, YASUTAKA
Executed: 2006-08-09
SUGIYAMA, AKIYUKI
Executed: 2006-08-10
MATSUOKA, RYOICHI
Executed: 2006-08-09
SUTANI, TAKUMICHI
Executed: 2006-08-10
NAYA, HIDEMITSU
Executed: 2006-08-21
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Apparatus of Pattern Inspection and Semiconductor Inspection System Using the Same
Patent: 7,507,961 →
Application: 11/453,229 →
Publication: US 2007/0023653
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →