IP Library › Assignment 018325/0179
Patent Assignment
Reel/Frame 018325/0179

Assignment of Assignor's Interest

Recorded: 2006-09-19 Pages: 2
Assignors
UEDI, MASATO
Executed: 2006-08-09
SOBUE, MAMORU
Executed: 2006-08-04
NAGAYA, KOUHEI
Executed: 2006-08-01
INOUE, TAKESHI
Executed: 2006-08-04
GOTOU, YOSHINORI
Executed: 2006-08-01
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Method and Apparatus for Inspecting Element Layout in Semiconductor Device
Application: 11/523,040 →
Publication: US 2007/0234262
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 10, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021985/0715 →
Change of Name Jul 27, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024794/0500 →