IP Library Assignment 018380/0803
Patent Assignment
Reel/Frame 018380/0803

Assignment of Assignor's Interest

Recorded: 2006-10-10 Pages: 2
Assignors
TAKAHASHI, HARUO
Executed: 2006-09-27
FUJII, TOSHIAKI
Executed: 2006-09-27
IKKU, YUTAKA
Executed: 2006-09-27
IWASAKI, KOUJI
Executed: 2006-09-27
YAMAMOTO, YO
Executed: 2006-09-27
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Charged Particle Beam Apparatus
Patent: 7,442,942 →
Application: 11/509,520 →
Publication: US 2007/0045560
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →