Patent Assignment
Reel/Frame 072903/0543
Change of Address
Recorded: 2025-09-17
Pages: 12
Assignor
HITACHI HIGH-TECH SCIENCE CORPORATION
Executed: 2020-02-12
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, 105-6411, JAPAN
Covered Properties
(50)
Processing Apparatus Using Focused Charged Particle Beam
Charged Particle Beam Apparatus
Focused Ion Beam Processing Method
Charged Particle Beam Scan and Irradiation Method, Charged Particle Beam Apparatus, Workpiece Observation Method and Workpiece Processing Method
Sample Holding Mechanism and Sample Working/Observing Apparatus
Fluorescent X-Ray Analysis Apparatus
Wafer Holder and Sample Producing Apparatus Using It
Fluorescent X-Ray Analysis Apparatus
Method of Correcting Opaque Defect of Photomask Using Atomic Force Microscope Fine Processing Device
Semiconductor Mask Correcting Device and Semiconductor Mask Correcting Method
Working Method Utilizing Irradiation of Charged Particle Beam Onto Sample Through Passage in Gas Blowing Nozzle
Fluorescent X-Ray Analysis Apparatus
Energy Dispersion Type Radiation Detecting System and Method of Measuring Content of Object Element
Focused Ion Beam Apparatus and Sample Section Forming and Thin-Piece Sample Preparing Methods
Thermal Analysis Apparatus
Optical Displacement Detection Mechanism and Surface Information Measurement Device Using the Same
Method of Fabricating Grabbing Face of Sample Grabbing Portion
Apparatus for Working and Observing Samples and Method of Working and Observing Cross Sections
Sample Relocation Method in Charged Particle Beam Apparatus and Charged Particle Beam Apparatus as Well as Sample for Transmission Electron Microscope
Tweezer-Equipped Scanning Probe Microscope and Transfer Method
Composite Charged-Particle Beam System
Charged-Particle Beam Apparatus
Method of Preparing a Transmission Electron Microscope Sample and a Sample Piece for a Transmission Electron Microscope
Sample Preparing Device and Sample Posture Shifting Method
Charged Particle Beam Apparatus and Method Adjusting Axis of Aperture
X-Ray Analysis Apparatus and X-Ray Analysis Method
Charged Particle Beam Apparatus
Section Processing Method and Its Apparatus
Method for Fabricating Euvl Mask
Charged Particle Beam Apparatus and Method of Adjusting Charged Particle Optics
X-Ray Analyzer and X-Ray Analysis Method
X-Ray Analyzer and X-Ray Analysis Method
Element Mapping Apparatus and Element Mapping Image Display Method
Focused Ion Beam Apparatus, Sample Processing Method Using the Same, and Computer Program for Focused Ion Beam Processing
Differential Scanning Calorimeter
Cross Section Processing Method and Method of Manufacturing Cross Section Observation Sample
Approach Method for Probe and Sample in Scanning Probe Microscope
Focused Ion Beam System and Sample Processing Method Using the Same
Focused Ion Beam Apparatus
Composite Focused Ion Beam Device, and Processing Observation Method and Processing Method Using the Same
Photomask Defect Correcting Method and Device
Composite Focused Ion Beam Device, Process Observation Method Using the Same,and Processing Method
X-Ray Inspection Device and X-Ray Inspection Method
Thermal Analysis Apparatus
X-Ray Analysis Apparatus and X-Ray Analysis Method
Method and Apparatus for Cross-Section Processing and Observation
Electron Microscope and Specimen Analyzing Method
Focused ion beam apparatus
X-Ray Transmission Inspection Apparatus and X-Ray Transmission Inspection Method
Differential Scanning Calorimeter
Related Assignments
(19)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 10, 2006
From: YAMAMOTO, YO; TAKAHASHI, HARUO; FUJII, TOSHIAKI
To: SII NANOTECHNOLOGY INC.
Reel/Frame 018386/0639 →
Assignment of Assignor's Interest
Oct 10, 2006
From: TAKAHASHI, HARUO; FUJII, TOSHIAKI; IKKU, YUTAKA; IWASAKI, KOUJI
To: SII NANOTECHNOLOGY INC.
Reel/Frame 018380/0803 →
Assignment of Assignor's Interest
Jan 8, 2007
From: KOZAKAI, TOMOKAZU; MURAMATSU, MASASHI; HAGIWARA, RYOJI
To: SII NANO TECHNOLOGY INC.
Reel/Frame 018776/0298 →
Assignment of Assignor's Interest
Jan 26, 2007
From: HAGIWARA, RYOJI; SUGIYAMA, YASUHIKO; KOZAKAI, TOMOKAZU
To: SII NANO TECHNOLOGY INC.
Reel/Frame 018844/0273 →
Assignment of Assignor's Interest
May 29, 2007
From: SUZUKI, HIROYUKI
To: SII NANO TECHNOLOGY INC.
Reel/Frame 019391/0862 →
Assignment of Assignor's Interest
May 29, 2007
From: MATOBA, YOSHIKI
To: SII NANO TECHNOLOGY INC.
Reel/Frame 019391/0868 →
Assignment of Assignor's Interest
Jun 18, 2007
From: FUKAI, TAKAYUKI; MATOBA, YOSHIKI
To: SII NANO TECHNOLOGY INC.
Reel/Frame 019473/0919 →
Assignment of Assignor's Interest
Jul 23, 2007
From: DOI, TOSHIO; WATANABE, KAZUTOSHI; TAKAOKA, OSAMU; UEMOTO, ATSUSHI
To: SII NANO TECHNOLOGY INC.
Reel/Frame 019634/0044 →
Assignment of Assignor's Interest
Jul 27, 2007
From: FUKAI, TAKAYUKI; MATOBA, YOSHIKI; TAKAHASHI, MASANORI
To: SII NANO TECHNOLOGY INC.
Reel/Frame 019659/0645 →
Assignment of Assignor's Interest
Jul 27, 2007
From: KATO, KOKORO
To: SII NANO TECHNOLOGY INC.
Reel/Frame 019645/0024 →
Assignment of Assignor's Interest
Sep 13, 2007
From: HASUDA, MASAKATSU; OKABE, MAMORU
To: SII NANO TECHNOLOGY INC.
Reel/Frame 019823/0039 →
Assignment of Assignor's Interest
Sep 20, 2007
From: MATOBA, YOSHIKI; HASEGAWA, KIYOSHI; FUKAI, TAKAYUKI
To: SII NANO TECHNOLOGY INC.
Reel/Frame 019855/0191 →
Assignment of Assignor's Interest
Oct 17, 2007
From: IYOKI, MASATO; YAMAMOTO, HIROYOSHI; WATANABE, KAZUTOSHI; SHIGENO, MASATSUGU
To: SII NANO TECHNOLOGY INC.
Reel/Frame 019976/0473 →
Assignment of Assignor's Interest
Oct 18, 2007
From: TASHIRO, JUNICHI; IKKU, YUTAKA; FUJII, TOSHIAKI
To: SII NANO TECHNOLOGY INC.
Reel/Frame 019980/0108 →
Assignment of Assignor's Interest
Mar 19, 2008
From: MUNEKANE, MASANAO
To: SII NANOTECHNOLOGY INC.
Reel/Frame 020673/0009 →
Assignment of Assignor's Interest
Jul 29, 2008
From: NAGASAWA, KANJI; NAKATANI, RINTARO
To: SII NANO TECHNOLOGY INC.
Reel/Frame 021309/0374 →
Change of Name
Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →
Change of Name
Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →
Change of Name
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →