IP Library Granted Patent US 8,422,630
Granted Patent B2
US 8,422,630 · App. 12/802,401 · Granted Apr 16, 2013

X-ray inspection device and X-ray inspection method

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Quick Facts
Patent No.
US 8,422,630
App. No.
12/802,401
Granted
Apr 16, 2013
Kind
B2
Abstract

In order to prevent misdetection and erroneous detection by clearly determining only a contrast caused by a foreign matter, there are provided an X-ray inspection method and an X-ray inspection device including: an X-ray tube ( 11 ) for irradiating a measurement sample with a characteristic X-ray having energy lower than an X-ray absorption edge of one element contained in the measurement sample and having energy higher than an X-ray absorption edge of a detection element; an X-ray detector ( 13 ) for receiving a transmission X-ray obtained when the X-ray passes through the sample; and an operation portion ( 15 ) for obtaining a contrast image from a transmission image of the transmission X-ray.

Claims (14)

1. A method for detecting whether Fe is present as foreign matter in a manufactured sample containing lithium cobalt oxide, comprising the steps:

irradiating the manufactured sample containing lithium cobalt oxide with characteristic x-rays generated by an x-ray tube having Ni target tube, the characteristic x-rays having energy lower than an x-ray absorption edge of a constituent element of the sample and having energy higher than an x-ray absorption edge of Fe so that Fe present in the sample absorbs the characteristic x-rays to a greater degree than the constituent element of the sample;

detecting the intensity of the characteristic x-rays that pass through the sample; and

creating an image which shows a distribution of the detected intensity of the characteristic x-rays passing through the sample and in which Fe present in the sample appears in clear contrast.

2. A method according to claim 1 ; wherein the irradiating step includes, before irradiating the sample with characteristic x-rays, passing the characteristic x-rays through a Co foil filter having an x-ray absorption edge of energy higher than that of the characteristic x-rays.

3. A method according to claim 1 ; wherein the manufactured sample is an electrode of a secondary battery.

4. A method according to claim 1 ; wherein the manufactured sample is an electrode of a lithium-ion secondary battery.

5. A method for detecting whether Cr is present as foreign matter in a manufactured sample containing lithium manganese oxide, comprising the steps:

irradiating the manufactured sample containing lithium manganese oxide with characteristic x-rays generated by an x-ray tube having an Fe target tube, the characteristic x-rays having energy lower than an x-ray absorption edge of a constituent element of the sample and having energy higher than an x-ray absorption edge of Cr so that Cr present in the sample absorbs the characteristic x-rays to a greater degree than the constituent element of the sample;

detecting the intensity of the characteristic x-rays that pass through the sample; and

creating an image which shows a distribution of the detected intensity of the characteristic x-rays passing through the sample and in which Cr present in the sample appears in clear contrast.

6. A method according to claim 5 ; wherein the irradiating step includes, before irradiating the sample with characteristic x-rays, passing the characteristic x-rays through a Mn foil filter having an x-ray absorption edge of energy higher than that of the characteristic x-rays.

7. A method according to claim 5 ; wherein the manufactured sample is an electrode of a secondary battery.

8. A method according to claim 5 ; wherein the manufactured sample is an electrode of a lithium-ion secondary battery.

Assignments (4)
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →
CHANGE OF NAME Recorded Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2010
From: MATOBA, YOSHIKI
To: SII NANO TECHNOLOGY INC.
Reel/Frame 024680/0382 →