IP Library › Assignment 024680/0382
Patent Assignment
Reel/Frame 024680/0382

Assignment of Assignor's Interest

Recorded: 2010-07-12 Pages: 3
Assignor
MATOBA, YOSHIKI
Executed: 2010-06-24
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
X-Ray Inspection Device and X-Ray Inspection Method
Patent: 8,422,630 →
Application: 12/802,401 →
Publication: US 2010/0316187
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →