IP Library Granted Patent US 8,279,225
Granted Patent B2
US 8,279,225 · App. 12/544,586 · Granted Oct 2, 2012

Element mapping apparatus and element mapping image display method

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Quick Facts
Patent No.
US 8,279,225
App. No.
12/544,586
Granted
Oct 2, 2012
Kind
B2
Abstract

Distribution images that are element mapping images displayed on a parent window of a display unit are switched by selecting a particular element or an analysis line to be displayed on a display element screen or a screen switch button using a keyboard or a mouse, so that the plural distribution images overlap to be overwritten at the same large size.

Claims (20)

1. An element mapping apparatus comprising:

an excitation source that irradiates excitation particles on a sample;

a detector that detects characteristic information of elements of the sample emitted from the sample;

an analyzer that obtains the concentration of each kind of element on the basis of the characteristic information to the elements;

a data storage device that obtains and stores an element mapping image by matching the concentration of each kind of element with a measured pixel position, the element mapping image comprising a first element mapping image for a first element and a first analysis line and a second element mapping image for a second element and a second analysis line, the first element mapping image depicting the sample with distribution of the first element with a predetermined view and the second element mapping image depicting the sample with distribution of the second element with the predetermined view, whereby information on the sample is obtained without disassembling the sample; and

an image display device that displays distribution screens showing the element mapping image;

wherein the distribution screens having the same size overlap with and are superimposed on one another, and the distribution screens are sequentially switched such that the first element mapping image is selected, displayed and overwritten by the second element mapping image whereby difference between element distribution states in the element mapping images can be recognized.

2. The element mapping apparatus according to claim 1 , wherein the distribution screen shows plural analysis lines of the same element.

3. The element mapping apparatus according to claim 1 , wherein the image display device sequentially switches between the distribution screens that are plural element mapping images selected at a predetermined time interval or by an input device so as to be displayed.

4. An element mapping image display method comprising:

irradiating excitation particles on a sample by an excitation source;

detecting characteristic information to the elements of the sample emitted from the sample by a detector;

obtaining the concentration of each kind of element on the basis of the characteristic information to the elements by an analyzer;

obtaining and storing an element mapping image by matching the concentration of each kind of element with a measured pixel position by a data storage device, the element mapping image comprising a first element mapping image for a first element and a first analysis line and a second element mapping image for a second element and a second analysis line, the first element mapping image depicting the sample with distribution of the first element with a predetermined view and the second element mapping image depicting the sample with distribution of the second element with the predetermined view, whereby information on the sample is obtained without disassembling the sample; and

displaying one of a plurality of distribution screens showing the element mapping image, wherein displaying one of the distribution screens comprises:

arranging the distribution screens having the same size to overlap with and be superimposed on one another; and

sequentially switching between the distribution screens to display one distribution screen at a time such that the first element mapping image is selected, displayed and overwritten by the second element mapping image;

whereby difference between element distribution states in the element mapping images can be recognized.

5. The element mapping image display method according to claim 4 , wherein the distribution screen switches between plural analysis lines of the same element.

6. The element mapping image display method according to claim 4 , wherein sequentially switching between the distribution screens comprises sequentially switching between the distribution screens at a predetermined time interval.

Assignments (4)
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →
CHANGE OF NAME Recorded Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 20, 2009
From: YAGI, ISAO
To: SII NANOTECHNOLOGY INC.
Reel/Frame 023126/0642 →