Patent Assignment
Reel/Frame 019855/0191
Assignment of Assignor's Interest
Recorded: 2007-09-20
Pages: 3
Assignors
MATOBA, YOSHIKI
Executed: 2007-08-27
HASEGAWA, KIYOSHI
Executed: 2007-08-24
FUKAI, TAKAYUKI
Executed: 2007-08-24
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Energy Dispersion Type Radiation Detecting System and Method of Measuring Content of Object Element
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →
Change of Address
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →