IP Library Assignment 021309/0374
Patent Assignment
Reel/Frame 021309/0374

Assignment of Assignor's Interest

Recorded: 2008-07-29 Pages: 3
Assignors
NAGASAWA, KANJI
Executed: 2007-09-13
NAKATANI, RINTARO
Executed: 2007-09-12
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Thermal Analysis Apparatus
Patent: 7,744,273 →
Application: 11/841,400 →
Publication: US 2008/0279249
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →