IP Library › Assignment 018470/0618
Patent Assignment
Reel/Frame 018470/0618

Assignment of Assignor's Interest

Recorded: 2006-10-27 Pages: 3
Assignors
TAKAHASHI, NAOHIRO
Executed: 2006-09-22
IRINO, KIYOSHI
Executed: 2006-09-27
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Inspecting Method, Inspecting Apparatus, and Method of Manufacturing Semiconductor Device
Patent: 7,340,352 →
Application: 11/588,319 →
Publication: US 2007/0255513
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 9, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0089 →
Change of Name Jul 9, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024651/0744 →
Change of Address Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →