Patent Assignment
Reel/Frame 018591/0668
Assignment of Assignor's Interest
Recorded: 2006-11-20
Pages: 2
Assignor
KAITO, TAKASHI
Executed: 2006-11-10
Assignee
SII NANTECHNOLOGY INC.
8, NAKASE 1-CHOME MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Atom Probe Apparatus and Method for Working Sample Preliminarily for the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.