IP Library › Assignment 018638/0717
Patent Assignment
Reel/Frame 018638/0717

Assignment of Assignor's Interest

Recorded: 2006-12-15 Pages: 3
Assignors
YAMASHITA, KAZUYUKI
Executed: 2006-10-25
MASUO, YOSHIYUKI
Executed: 2006-10-25
Assignee
ADVANTEST CORPORATION
32-1, ASAHICHO 1-CHOME, NWEIMA-KU, TOKYO, 179-0071, JAPAN
Covered Property (1)
Electronic Device Test Apparatus and Method of Configuring Electronic Device Test Apparatus
Patent: 7,919,974 →
Application: 11/570,682 →
Publication: US 2008/0042667
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Corrective Assignment to Correct the 32-1, Asaicho 1-Chome, Nweima-Ku, Tokyo, Japan Previously Recorded on Reel 018638 Frame 0717. Assignor(S) Hereby Confirms the 32-1, Asahicho 1-Chome, Nerima-Ku, Tokyo, Japan. Nov 30, 2010
From: YAMASHITA, KAZUYUKI; MASUO, YOSHIYUKI
To: ADVANTEST CORPORATION
Reel/Frame 025414/0069 →