Patent Assignment
Reel/Frame 018953/0141
Assignment of Assignor's Interest
Recorded: 2007-03-02
Pages: 3
Assignors
NISHIYAMA, HIDETOSHI
Executed: 2001-07-12
NOGUCHI, MINORI
Executed: 2001-07-13
OOSHIMA, YOSHIMASA
Executed: 2001-07-13
HAMAMATSU, AKIRA
Executed: 2001-07-13
WATANABE, KENJI
Executed: 2001-07-12
WATANABE, TETSUYA
Executed: 2001-07-13
JINGU, TAKAHIRO
Executed: 2001-07-13
Assignees
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
HITACHI ELECTRONICS ENGINEERING CO., LTD.
F-NISSEI FBISU BLDG., 16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO, JAPAN
Covered Property
(1)
Method and Its Apparatus for Inspecting Particles or Defects of a Semiconductor Device
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Mar 2, 2007
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 018953/0222 →
Assignment of Assignor's Interest
Mar 2, 2007
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 018953/0294 →
Change of Name
Mar 2, 2007
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 018955/0650 →
Corrective Assignment to Correct the Conveying Party Data and Receiving Party Data Needs to Be Switched. Previously Recorded on Reel 018955 Frame 0650. Assignor(S) Hereby Confirms the Change of Name.
May 10, 2007
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 019275/0676 →