IP Library › Assignment 018955/0650
Patent Assignment
Reel/Frame 018955/0650

Change of Name

Recorded: 2007-03-02 Pages: 6
Assignor
Assignee
HITACHI ELECTRONICS ENGINEERING CO., LTD.
16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO, JAPAN
Covered Property (1)
Method and Its Apparatus for Inspecting Particles or Defects of a Semiconductor Device
Patent: 7,256,412 →
Application: 11/516,344 →
Publication: US 2007/0001132
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 2, 2007
From: NISHIYAMA, HIDETOSHI; NOGUCHI, MINORI; OOSHIMA, YOSHIMASA; HAMAMATSU, AKIRA
To: HITACHI, LTD.; HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 018953/0141 →
Assignment of Assignor's Interest Mar 2, 2007
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 018953/0222 →
Assignment of Assignor's Interest Mar 2, 2007
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 018953/0294 →
Corrective Assignment to Correct the Conveying Party Data and Receiving Party Data Needs to Be Switched. Previously Recorded on Reel 018955 Frame 0650. Assignor(S) Hereby Confirms the Change of Name. May 10, 2007
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 019275/0676 →