IP Library Assignment 019089/0482
Patent Assignment
Reel/Frame 019089/0482

Assignment of Assignor's Interest

Recorded: 2007-03-13 Pages: 4
Assignor
DU-NOUR, OFER
Executed: 2007-03-11
Assignee
TEVET PCT LTD.
P.O. BOX 690 BUILDING 2, AREA 7, INDUSTRIAL PARK, YOKNE'AM, 20892, ISRAEL
Covered Property (1)
Method and Apparatus for Process Control with in-Die Metrology
Patent: 7,469,164 →
Application: 11/717,327 →
Publication: US 2007/0298522
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 7, 2008
From: TEVET PROCESS CONTROL TECHNOLOGIES, LTD.
To: NANOMETRICS INCORPORATED
Reel/Frame 021194/0642 →
Change of Name Apr 30, 2020
From: NANOMETRICS INCORPORATED
To: ONTO INNOVATION INC.
Reel/Frame 052544/0224 →