Patent Assignment
Reel/Frame 021194/0642
Assignment of Assignor's Interest
Recorded: 2008-07-07
Pages: 5
Assignor
TEVET PROCESS CONTROL TECHNOLOGIES, LTD.
Executed: 2008-07-03
Assignee
NANOMETRICS INCORPORATED
1550 BUCKEYE DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Properties
(6)
Method and Apparatus for Measuring Lateral Variations in Thickness or Refractive Index of a Transparent Film on a Substrate
Patent:
6,801,321 →
Application:
09/762,473 →
Method and Apparatus for Production Line Screening
Method and Apparatus for Measuring Stress in Semiconductor Wafers
Method and Apparatus for Thickness Decomposition of Complicated Layer Structures
Method and Apparatus for Process Control with in-Die Metrology
Method and Apparatus for Measuring Thickness and Optical Properties of a Thin-Film on a Substrate
Patent:
7,492,467 →
Application:
11/823,452 →
Related Assignments
(7)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Feb 7, 2001
From: DU-NOUR, OFER
To: TEVET PROCESS CONTROL TECHNOLOGIES LTD
Reel/Frame 011563/0713 →
Assignment of Assignor's Interest
Jul 2, 2001
From: DU-NOUR, OFER
To: TEVET PROCESS CONTROL TECHNOLOGIES LTD.
Reel/Frame 011974/0348 →
Assignment of Assignor's Interest
Nov 26, 2001
From: DU-NOUR, OFER; ISH-SHALOM, YARON
To: TEVET PROCESS CONTROL TECHNOLOGIES LTD.
Reel/Frame 012326/0158 →
Assignment of Assignor's Interest
Oct 28, 2002
From: DU-NOUR, OFER; RUBINSTEIN, VLADIMIR
To: TEVET PROCESS CONTROL TECHNOLOGIES LTD.
Reel/Frame 013445/0873 →
Assignment of Assignor's Interest
Mar 13, 2007
From: DU-NOUR, OFER
To: TEVET PCT LTD.
Reel/Frame 019089/0482 →
Assignment of Assignor's Interest
Jun 26, 2007
From: RUBINSTEIN, VLADIMIR; DU-NOUR, OFER
To: TEVET PCT LTD.
Reel/Frame 019533/0622 →
Change of Name
Apr 30, 2020
From: NANOMETRICS INCORPORATED
To: ONTO INNOVATION INC.
Reel/Frame 052544/0224 →