IP Library Assignment 019533/0622
Patent Assignment
Reel/Frame 019533/0622

Assignment of Assignor's Interest

Recorded: 2007-06-26 Pages: 4
Assignors
RUBINSTEIN, VLADIMIR
Executed: 2007-06-26
DU-NOUR, OFER
Executed: 2007-06-26
Assignee
TEVET PCT LTD.
P.O. BOX 690 BUILDING 2 AREA 7, INDUSTRIAL PARK, YOKNE'AM, 20892, ISRAEL
Covered Property (1)
Method and Apparatus for Measuring Thickness and Optical Properties of a Thin-Film on a Substrate
Patent: 7,492,467 →
Application: 11/823,452 →
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 7, 2008
From: TEVET PROCESS CONTROL TECHNOLOGIES, LTD.
To: NANOMETRICS INCORPORATED
Reel/Frame 021194/0642 →
Change of Name Apr 30, 2020
From: NANOMETRICS INCORPORATED
To: ONTO INNOVATION INC.
Reel/Frame 052544/0224 →