Patent Assignment
Reel/Frame 011563/0713
Assignment of Assignor's Interest
Recorded: 2001-02-07
Pages: 2
Assignor
DU-NOUR, OFER
Executed: 2001-02-01
Assignee
TEVET PROCESS CONTROL TECHNOLOGIES LTD
P.O. BOX 245, YOKUEAN MOSHAVA 20600, ISRAEL
Covered Property
(1)
Method and Apparatus for Measuring Lateral Variations in Thickness or Refractive Index of a Transparent Film on a Substrate
Patent:
6,801,321 →
Application:
09/762,473 →
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.