IP Library Assignment 012326/0158
Patent Assignment
Reel/Frame 012326/0158

Assignment of Assignor's Interest

Recorded: 2001-11-26 Pages: 2
Assignors
DU-NOUR, OFER
Executed: 2001-11-20
ISH-SHALOM, YARON
Executed: 2001-11-20
Assignee
TEVET PROCESS CONTROL TECHNOLOGIES LTD.
P.O. BOX 5667, MIGDAL HAEMEK, 23513, ISRAEL
Covered Property (1)
Method and Apparatus for Measuring Stress in Semiconductor Wafers
Patent: 6,678,055 →
Application: 09/991,709 →
Publication: US 2003/0098704
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 7, 2008
From: TEVET PROCESS CONTROL TECHNOLOGIES, LTD.
To: NANOMETRICS INCORPORATED
Reel/Frame 021194/0642 →
Change of Name Apr 30, 2020
From: NANOMETRICS INCORPORATED
To: ONTO INNOVATION INC.
Reel/Frame 052544/0224 →