Patent Assignment
Reel/Frame 019099/0586
Assignment of Assignor's Interest
Recorded: 2007-04-02
Pages: 2
Assignor
TANAMACHI, TAKAHIRO
Executed: 2007-02-02
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property
(1)
Semiconductor Wafer Testing Apparatus and Method of Testing Semiconductor Wafer
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.