IP Library › Assignment 019143/0499
Patent Assignment
Reel/Frame 019143/0499

Assignment of Assignor's Interest

Recorded: 2007-04-02 Pages: 2
Assignors
HIGASHI, HIROSHI
Executed: 2007-03-08
WATANABE, TETSUYA
Executed: 2007-03-08
AIKO, KENJI
Executed: 2007-03-08
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Wafer Surface Observing Method and Apparatus
Patent: 8,577,119 →
Application: 11/698,987 →
Publication: US 2007/0269100
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →