Patent Assignment
Reel/Frame 019149/0945
Assignment of Assignor's Interest
Recorded: 2007-03-28
Pages: 3
Assignor
FURUYA, NOBUO
Executed: 2007-03-19
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit Device and Delay Fault Testing Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.