Patent Assignment
Reel/Frame 019152/0249
Assignment of Assignor's Interest
Recorded: 2007-04-12
Pages: 2
Assignors
TOMITA, YASUHIRO
Executed: 2006-11-16
KOMIYA, MANABU
Executed: 2006-11-16
SUWA, HITOSHI
Executed: 2006-11-16
MORI, TOSHIKI
Executed: 2006-11-16
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, 571-8501, JAPAN
Covered Property
(1)
Semiconductor Leakage Current Detector and Leakage Current Measurement Method, Semiconductor Leakage Current Detector with Voltage Trimming Function and Reference Voltage Trimming Method, and Semiconductor Intergrated Circuit Thereof
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.