IP Library › Assignment 019169/0540
Patent Assignment
Reel/Frame 019169/0540

Assignment of Assignor's Interest

Recorded: 2007-04-09 Pages: 2
Assignors
TACHIBANA, ICHIRO
Executed: 2007-01-11
SATO, MITSUGU
Executed: 2007-01-29
FUKADA, ATSUKO
Executed: 2007-01-18
SUZUKI, NAOMASA
Executed: 2007-02-02
FUKUDA, MUNEYUKI
Executed: 2007-01-18
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHIMBASHI, MINATO-KU, TOKYO 105-8717, JAPAN
Covered Property (1)
Scanning Electron Microscope and Apparatus for Detecting Defect
Patent: 7,504,626 →
Application: 11/655,264 →
Publication: US 2007/0187598
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →