IP Library › Assignment 019391/0695
Patent Assignment
Reel/Frame 019391/0695

Assignment of Assignor's Interest

Recorded: 2007-06-06 Pages: 2
Assignors
PAN, SHING-CHYANG
Executed: 2007-02-15
LIN, WEI-JUNG
Executed: 2007-02-15
HUANG, TSUNG-HSUN
Executed: 2007-02-15
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
NO. 8, LI-HSIN RD. 6, SCIENCE-BASED INDUSTRIAL PARK, HSIN-CHU, 300-77, TAIWAN
Covered Property (1)
System and Method for Film Stress and Curvature Gradient Mapping for Screening Problematic Wafers
Patent: 7,805,258 →
Application: 11/707,662 →
Publication: US 2008/0199978
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 19, 2010
From: FU, HSUEH-HUNG; CHANG, CHIH-WEI; CHEN, SHIH-CHANG; CHANG, CHIN-PIAO
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 024858/0251 →